SSRL Crystallography Grids 800 Micron Holes
High-density Crystallography Grids – SSRL/SAM Compatible Design
Features: Circular 800 micron diameter holes
Frame Thickness: 200 microns
Thin-film Backing: 6 micron film
Premounting: Epoxied into SAM Compatible Base
Package of 10
Product Information
Designed to enabled high-throughput data collection from multiple crystals on a single grid. The SSRL Crystallography grids were developed by Aina Cohen and the team SSRL.
Reference:
High-density grids for efficient data collection from multiple crystals
February 2016 Acta Crystallographica Section D Structural Biology 72(1)
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